Fault-based product-line testing: effective sample generation based on feature-diagram mutation
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Dennis Reuling, Johannes Bürdek, Serge Rotärmel, Malte Lochau, Udo Kelter
Fault-based product-line testing: effective sample generation based on feature-diagram mutation
SPLC, 2015.

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@inproceedings{SPLC-2015-ReulingBRLK,
	author        = "Dennis Reuling and Johannes Bürdek and Serge Rotärmel and Malte Lochau and Udo Kelter",
	booktitle     = "{Proceedings of the 19th International Software Product Line Conference}",
	doi           = "10.1145/2791060.2791074",
	isbn          = "978-1-4503-3613-0",
	pages         = "131--140",
	publisher     = "{ACM}",
	title         = "{Fault-based product-line testing: effective sample generation based on feature-diagram mutation}",
	year          = 2015,
}

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