Dennis Reuling, Johannes Bürdek, Serge Rotärmel, Malte Lochau, Udo Kelter
Fault-based product-line testing: effective sample generation based on feature-diagram mutation
SPLC, 2015.
@inproceedings{SPLC-2015-ReulingBRLK, author = "Dennis Reuling and Johannes Bürdek and Serge Rotärmel and Malte Lochau and Udo Kelter", booktitle = "{Proceedings of the 19th International Software Product Line Conference}", doi = "10.1145/2791060.2791074", isbn = "978-1-4503-3613-0", pages = "131--140", publisher = "{ACM}", title = "{Fault-based product-line testing: effective sample generation based on feature-diagram mutation}", year = 2015, }