Travelled to:
1 × USA
Collaborated with:
D.Reuling J.Bürdek M.Lochau U.Kelter
Talks about:
base (2) product (1) generat (1) diagram (1) featur (1) effect (1) sampl (1) mutat (1) fault (1) test (1)
Person: Serge Rotärmel
DBLP: Rot=auml=rmel:Serge
Contributed to:
Wrote 1 papers:
- SPLC-2015-ReulingBRLK #effectiveness #generative #product line #testing
- Fault-based product-line testing: effective sample generation based on feature-diagram mutation (DR, JB, SR, ML, UK), pp. 131–140.