Travelled to:
2 × Germany
Collaborated with:
R.Ubar Z.Peng S.Devadze J.Raik
Talks about:
simul (2) techniqu (1) parallel (1) diagram (1) circuit (1) critic (1) binari (1) trace (1) fault (1) digit (1)
Person: Artur Jutman
DBLP: Jutman:Artur
Contributed to:
Wrote 2 papers:
- DATE-2010-UbarDRJ #parallel #simulation
- Parallel X-fault simulation with critical path tracing technique (RU, SD, JR, AJ), pp. 879–884.
- DATE-2001-UbarJP #diagrams #simulation
- Timing simulation of digital circuits with binary decision diagrams (RU, AJ, ZP), pp. 460–466.