Travelled to:1 × Japan
1 × United Kingdom
3 × USA
Collaborated with:M.D.Ernst S.K.Lahiri T.Ball M.d'Amorim T.Xie D.Marinov J.H.Perkins S.Kim S.Larsen S.P.Amarasinghe J.Bachrach M.Carbin F.Sherwood S.Sidiroglou G.Sullivan W.Wong Y.Zibin M.C.Rinard
Talks about:test (4) generat (3) feedback (2) classif (2) automat (2) random (2) direct (2) error (2) comparison (1) techniqu (1)
Person: Carlos Pacheco
DBLP: Pacheco:Carlos
Contributed to:
2009
2008
2007
2006
2005Wrote 5 papers:
- SOSP-2009-PerkinsKLABCPSSSWZER #automation #fault
- Automatically patching errors in deployed software (JHP, SK, SL, SPA, JB, MC, CP, FS, SS, GS, WFW, YZ, MDE, MCR), pp. 87–102.
- ISSTA-2008-PachecoLB #dot-net #fault #random testing #testing
- Finding errors in .net with feedback-directed random testing (CP, SKL, TB), pp. 87–96.
- ICSE-2007-PachecoLEB #generative #random testing #testing
- Feedback-Directed Random Test Generation (CP, SKL, MDE, TB), pp. 75–84.
- ASE-2006-dAmorimPXME #automation #classification #comparison #empirical #generative #object-oriented #testing
- An Empirical Comparison of Automated Generation and Classification Techniques for Object-Oriented Unit Testing (Md, CP, TX, DM, MDE), pp. 59–68.
- ECOOP-2005-PachecoE #automation #classification #generative #named #testing
- Eclat: Automatic Generation and Classification of Test Inputs (CP, MDE), pp. 504–527.