Travelled to:1 × Canada
1 × France
Collaborated with:A.Chung H.E.Motteler
Talks about:protocol (2) test (2) suffici (1) generat (1) coverag (1) method (1) effici (1) condit (1) applic (1) fault (1)
Person: Deepinder P. Sidhu
DBLP: Sidhu:Deepinder_P=
Contributed to:
19931992Wrote 2 papers:
- IWPTS-1993-MottelerCS #fault #protocol #testing
- Fault Coverage of UIO-based Methods for Protocol Testing (HEM, AC, DPS), pp. 21–34.
- IWPTS-1992-ChungS #generative #performance #protocol #testing
- Applications of Sufficient Conditions for Efficient Protocol Test Generation (AC, DPS), pp. 219–228.