Travelled to:
1 × USA
Collaborated with:
R.A.Rasmussen L.J.Vidunas W.T.Davis
Talks about:
generat (1) delay (1) test (1)
Person: E. R. Hsieh
DBLP: Hsieh:E=_R=
Contributed to:
Wrote 1 papers:
- DAC-1977-HsiehRVD #generative #testing
- Delay test generation (ERH, RAR, LJV, WTD), pp. 486–491.