Travelled to:
1 × USA
Collaborated with:
E.G.Ulrich T.E.Baker
Talks about:
techniqu (1) analysi (1) simul (1) logic (1) fault (1) test (1) base (1)
Person: L. R. Williams
DBLP: Williams:L=_R=
Contributed to:
Wrote 1 papers:
- DAC-1972-UlrichBW #analysis #logic #simulation
- Fault-test analysis techniques based on logic simulation (EGU, TEB, LRW), pp. 111–115.