Travelled to:4 × USA
Collaborated with:E.G.Ulrich K.A.Roberts D.H.Jerome L.R.Williams D.M.Schuler S.P.Bryant
Talks about:simul (3) concurr (2) logic (2) test (2) base (2) techniqu (1) network (1) generat (1) analysi (1) vertic (1)
Person: Thomas E. Baker
DBLP: Baker:Thomas_E=
Contributed to:
1981197519731972Wrote 4 papers:
- DAC-1981-RobertsBJ #database #design
- A vertically organized computer-aided design data base (KAR, TEB, DHJ), pp. 595–602.
- DAC-1975-SchulerUBB #concurrent #generative #logic #random testing #simulation #testing #using
- Random test generation using concurrent logic simulation (DMS, EGU, TEB, SPB), pp. 261–267.
- DAC-1973-UlrichB #concurrent #network #simulation
- The concurrent simulation of nearly identical digital networks (EGU, TEB), pp. 145–150.
- DAC-1972-UlrichBW #analysis #logic #simulation
- Fault-test analysis techniques based on logic simulation (EGU, TEB, LRW), pp. 111–115.