Travelled to:
1 × USA
Collaborated with:
Z.S.Karnin A.Shpilka I.Volkovich
Talks about:
multilinear (1) determinist (1) circuit (1) ident (1) depth (1) bound (1) test (1) top (1) fan (1)
Person: Partha Mukhopadhyay
DBLP: Mukhopadhyay:Partha
Contributed to:
Wrote 1 papers:
- STOC-2010-KarninMSV #bound #multi #testing
- Deterministic identity testing of depth-4 multilinear circuits with bounded top fan-in (ZSK, PM, AS, IV), pp. 649–658.