Travelled to:1 × USA
Collaborated with:C.A.Harlow D.A.Rayfield R.J.Johnston S.J.D.III
Talks about:electron (1) inspect (1) assembl (1) autom (1)
Person: Scott E. Henderson
DBLP: Henderson:Scott_E=
Contributed to:
Wrote 1 papers:
- DAC-1974-HarlowHRJD #automation
- Automated inspection of electronic assemblies (CAH, SEH, DAR, RJJ, SJDI), pp. 98–106.












