Travelled to:
1 × USA
Collaborated with:
Y.Nakagawa
Talks about:
softwar (1) reliabl (1) complex (1) measur (1) model (1) error (1)
Person: Shuetsu Hanata
DBLP: Hanata:Shuetsu
Contributed to:
Wrote 1 papers:
- ICSE-1989-NakagawaH #complexity #fault #metric #reliability
- An Error Complexity Model for Software Reliability Measurement (YN, SH), pp. 230–236.