Travelled to:2 × USA
Collaborated with:W.K.Ehrlich ∅
Talks about:discrimin (1) softwar (1) reliabl (1) system (1) metric (1) growth (1) failur (1) cohers (1) modul (1) model (1)
Person: T. J. Emerson
DBLP: Emerson:T=_J=
Contributed to:
19871984Wrote 2 papers:
- ICSE-1987-EhrlichE #modelling #reliability #testing
- Modeling Software Failures and Reliability Growth During System Testing (WKE, TJE), pp. 72–82.
- ICSE-1984-Emerson #metric
- A Discriminant Metric for Module Cohersion (TJE), pp. 294–303.