Travelled to:
1 × Australia
Collaborated with:
J.Funada N.Ohta M.Mizoguchi T.Temma K.Nakanishi A.Murai T.Sugiuchi Y.Yamada
Talks about:
palmprint (1) extract (1) method (1) featur (1) elimin (1) consid (1) creas (1)
Person: Toshio Wakabayashi
DBLP: Wakabayashi:Toshio
Contributed to:
Wrote 1 papers:
- ICPR-1998-FunadaOMTNMSWY #feature model
- Feature extraction method for palmprint considering elimination of creases (JiF, NO, MM, TT, KN, AM, TS, TW, YY), pp. 1849–1854.