8 papers:
DAC-2013-KunduCSK- An ATE assisted DFD technique for volume diagnosis of scan chains (SK, SC, IS, RK), p. 6.
DATE-2010-MajidK #performance- Stretching the limits of FPGA SerDes for enhanced ATE performance (AMM, DCK), pp. 202–207.
- DATE-2008-BadarogluDLC #using
- Calibration of Integrated CMOS Hall Sensors Using Coil-on-Chip in ATE Environment (MB, GD, FL, OC), pp. 873–878.
CASE-2007-JinBS #approach- A Consolidated Approach to Minimize Semiconductor Production Loss Due to Unscheduled ATE Downtime (TJ, FB, CHS), pp. 188–193.
- DATE-2007-KeezerMD #multi
- Method for reducing jitter in multi-gigahertz ATE (DCK, DM, PD), pp. 701–706.
- DATE-2006-SrinivasanTC #automation #low cost #multi #online
- Online RF checkers for diagnosing multi-gigahertz automatic test boards on low cost ATE platforms (GS, FT, AC), pp. 658–663.
- DATE-2001-ZorianPTTPDSMR #embedded #tutorial
- Embedded tutorial: TRP: integrating embedded test and ATE (YZ, PP, JPT, ICT, CEP, OPD, JS, PM, WR), pp. 34–37.
VDME-1991-1-Puccetti #development #verification- The Integrated Software Development and Verification System ATES (AP), pp. 629–644.
