Stem copper$ (all stems)
2 papers:
- DAC-2013-MishraS #grid #power management
- The impact of electromigration in copper interconnects on power grid integrity (VM, SSS), p. 6.
- DATE-2010-BashirM #process #reliability #towards
- Towards a chip level reliability simulator for copper/low-k backend processes (MB, LSM), pp. 279–282.