Stem dopant$ (all stems)
2 papers:
- DAC-2008-YeLNC #modelling #simulation #statistics
- Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness (YY, FL, SRN, YC), pp. 900–905.
- DAC-2007-GuSK #modelling #random #statistics
- Width-dependent Statistical Leakage Modeling for Random Dopant Induced Threshold Voltage Shift (JG, SSS, CHK), pp. 87–92.