Yun Ye, Frank Liu, Sani R. Nassif, Yu Cao
Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness
DAC, 2008.
@inproceedings{DAC-2008-YeLNC, author = "Yun Ye and Frank Liu and Sani R. Nassif and Yu Cao", booktitle = "{Proceedings of the 45th Design Automation Conference}", doi = "10.1145/1391469.1391698", isbn = "978-1-60558-115-6", pages = "900--905", publisher = "{ACM}", title = "{Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness}", year = 2008, }