Dan Hao, Ying Pan, Lu Zhang, Wei Zhao, Hong Mei, Jiasu Sun
A similarity-aware approach to testing based fault localization
ASE, 2005.
@inproceedings{ASE-2005-HaoPZZMS,
author = "Dan Hao and Ying Pan and Lu Zhang and Wei Zhao and Hong Mei and Jiasu Sun",
booktitle = "{Proceedings of the 20th IEEE/ACM International Conference on Automated Software Engineering}",
doi = "10.1145/1101908.1101953",
pages = "291--294",
publisher = "{ACM}",
title = "{A similarity-aware approach to testing based fault localization}",
year = 2005,
}