Event-based fault detection of manufacturing cell: Data inconsistencies between academic assumptions and industry practice
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Lindsay V. Allen, Dawn M. Tilbury
Event-based fault detection of manufacturing cell: Data inconsistencies between academic assumptions and industry practice
CASE, 2010.

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@inproceedings{CASE-2010-AllenT,
	author        = "Lindsay V. Allen and Dawn M. Tilbury",
	booktitle     = "{Proceedings of the Sixth International Conference on Automation Science and Engineering}",
	doi           = "10.1109/COASE.2010.5584595",
	isbn          = "978-1-4244-5447-1",
	pages         = "426--432",
	publisher     = "{IEEE}",
	title         = "{Event-based fault detection of manufacturing cell: Data inconsistencies between academic assumptions and industry practice}",
	year          = 2010,
}

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