Lindsay V. Allen, Dawn M. Tilbury
Event-based fault detection of manufacturing cell: Data inconsistencies between academic assumptions and industry practice
CASE, 2010.
@inproceedings{CASE-2010-AllenT, author = "Lindsay V. Allen and Dawn M. Tilbury", booktitle = "{Proceedings of the Sixth International Conference on Automation Science and Engineering}", doi = "10.1109/COASE.2010.5584595", isbn = "978-1-4244-5447-1", pages = "426--432", publisher = "{IEEE}", title = "{Event-based fault detection of manufacturing cell: Data inconsistencies between academic assumptions and industry practice}", year = 2010, }