Daniel Kurz, Cristina De Luca, Jürgen Pilz
Sampling Decision System in semiconductor manufacturing using Virtual Metrology
CASE, 2012.
@inproceedings{CASE-2012-KurzDP, author = "Daniel Kurz and Cristina De Luca and Jürgen Pilz", booktitle = "{Proceedings of the Eighth International Conference on Automation Science and Engineering}", doi = "10.1109/CoASE.2012.6386366", isbn = "978-1-4673-0429-0", pages = "74--79", publisher = "{IEEE}", title = "{Sampling Decision System in semiconductor manufacturing using Virtual Metrology}", year = 2012, }