Daniel Kurz, Cristina De Luca, Jürgen Pilz
Sampling Decision System in semiconductor manufacturing using Virtual Metrology
CASE, 2012.
@inproceedings{CASE-2012-KurzDP,
author = "Daniel Kurz and Cristina De Luca and Jürgen Pilz",
booktitle = "{Proceedings of the Eighth International Conference on Automation Science and Engineering}",
doi = "10.1109/CoASE.2012.6386366",
isbn = "978-1-4673-0429-0",
pages = "74--79",
publisher = "{IEEE}",
title = "{Sampling Decision System in semiconductor manufacturing using Virtual Metrology}",
year = 2012,
}











