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Travelled to:
1 × Italy
1 × Korea
1 × USA
Collaborated with:
J.Pilz C.D.Luca J.Kaspar
Talks about:
semiconductor (2) manufactur (2) metrolog (2) virtual (2) system (2) sampl (2) decis (2) use (2) bayesian (1) reliabl (1)

Person: Daniel Kurz

DBLP DBLP: Kurz:Daniel

Contributed to:

CASE 20132013
CASE 20122012
CASE 20112011

Wrote 3 papers:

CASE-2013-KurzDP #monitoring #reliability
Monitoring virtual metrology reliability in a sampling decision system (DK, CDL, JP), pp. 20–25.
CASE-2012-KurzDP #using
Sampling Decision System in semiconductor manufacturing using Virtual Metrology (DK, CDL, JP), pp. 74–79.
CASE-2011-KurzKP #maintenance #network #using
Dynamic Maintenance in semiconductor manufacturing using Bayesian networks (DK, JK, JP), pp. 238–243.

Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
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