Simone Pampuri, Andrea Schirru, Gian Antonio Susto, Cristina De Luca, Alessandro Beghi, Giuseppe De Nicolao
Multistep virtual metrology approaches for semiconductor manufacturing processes
CASE, 2012.
@inproceedings{CASE-2012-PampuriSSLBN, author = "Simone Pampuri and Andrea Schirru and Gian Antonio Susto and Cristina De Luca and Alessandro Beghi and Giuseppe De Nicolao", booktitle = "{Proceedings of the Eighth International Conference on Automation Science and Engineering}", doi = "10.1109/CoASE.2012.6386484", isbn = "978-1-4673-0429-0", pages = "91--96", publisher = "{IEEE}", title = "{Multistep virtual metrology approaches for semiconductor manufacturing processes}", year = 2012, }