Automatic System Level Test Generation and Fault Location for Large Digital Systems
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Akihiko Yamada, Nobuo Wakatsuki, T. Fukui, Shigehiro Funatsu
Automatic System Level Test Generation and Fault Location for Large Digital Systems
DAC, 1978.

DAC 1978
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@inproceedings{DAC-1978-YamadaWFF,
	acmid         = "1067159",
	author        = "Akihiko Yamada and Nobuo Wakatsuki and T. Fukui and Shigehiro Funatsu",
	booktitle     = "{Proceedings of the 15th Design Automation Conference}",
	pages         = "347--352",
	publisher     = "{ACM}",
	title         = "{Automatic System Level Test Generation and Fault Location for Large Digital Systems}",
	year          = 1978,
}

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