Testing for bridging faults (shorts) in CMOS circuits
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John M. Acken
Testing for bridging faults (shorts) in CMOS circuits
DAC, 1983.

DAC 1983
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@inproceedings{DAC-1983-Acken,
	acmid         = "800749",
	author        = "John M. Acken",
	booktitle     = "{Proceedings of the 20th Design Automation Conference}",
	isbn          = "0-8186-0026-8",
	pages         = "717--718",
	publisher     = "{ACM/IEEE}",
	title         = "{Testing for bridging faults (shorts) in CMOS circuits}",
	year          = 1983,
}

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