Andrea S. LaPaugh, Richard J. Lipton
Total stuct-at-fault testing by circuit transformation
DAC, 1983.
@inproceedings{DAC-1983-LaPaughL,
acmid = "800748",
author = "Andrea S. LaPaugh and Richard J. Lipton",
booktitle = "{Proceedings of the 20th Design Automation Conference}",
isbn = "0-8186-0026-8",
pages = "713--716",
publisher = "{ACM/IEEE}",
title = "{Total stuct-at-fault testing by circuit transformation}",
year = 1983,
}











