Takuji Ogihara, Shinichi Murai, Yuzo Takamatsu, Kozo Kinoshita, Hideo Fujiwara
Test generation for scan design circuits with tri-state modules and bidirectional terminals
DAC, 1983.
@inproceedings{DAC-1983-OgiharaMTKF, acmid = "800643", author = "Takuji Ogihara and Shinichi Murai and Yuzo Takamatsu and Kozo Kinoshita and Hideo Fujiwara", booktitle = "{Proceedings of the 20th Design Automation Conference}", isbn = "0-8186-0026-8", pages = "71--78", publisher = "{ACM/IEEE}", title = "{Test generation for scan design circuits with tri-state modules and bidirectional terminals}", year = 1983, }