Test generation for scan design circuits with tri-state modules and bidirectional terminals
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Takuji Ogihara, Shinichi Murai, Yuzo Takamatsu, Kozo Kinoshita, Hideo Fujiwara
Test generation for scan design circuits with tri-state modules and bidirectional terminals
DAC, 1983.

DAC 1983
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@inproceedings{DAC-1983-OgiharaMTKF,
	acmid         = "800643",
	author        = "Takuji Ogihara and Shinichi Murai and Yuzo Takamatsu and Kozo Kinoshita and Hideo Fujiwara",
	booktitle     = "{Proceedings of the 20th Design Automation Conference}",
	isbn          = "0-8186-0026-8",
	pages         = "71--78",
	publisher     = "{ACM/IEEE}",
	title         = "{Test generation for scan design circuits with tri-state modules and bidirectional terminals}",
	year          = 1983,
}

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