@inproceedings{DAC-1986-ShihA,
	author        = "Hsi-Ching Shih and Jacob A. Abraham",
	booktitle     = "{Proceedings of the 23rd Design Automation Conference}",
	doi           = "10.1145/318013.318052",
	pages         = "243--249",
	publisher     = "{IEEE Computer Society Press}",
	title         = "{Transistor-level test generation for physical failures in CMOS circuits}",
	year          = 1986,
}