Robust test generation algorithm for stuck-open fault in CMOS circuits
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Weiwei Mao, Xieting Ling
Robust test generation algorithm for stuck-open fault in CMOS circuits
DAC, 1986.

DAC 1986
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@inproceedings{DAC-1986-WeiweiX,
	author        = "Weiwei Mao and Xieting Ling",
	booktitle     = "{Proceedings of the 23rd Design Automation Conference}",
	doi           = "10.1145/318013.318051",
	pages         = "236--242",
	publisher     = "{IEEE Computer Society Press}",
	title         = "{Robust test generation algorithm for stuck-open fault in CMOS circuits}",
	year          = 1986,
}

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