Weiwei Mao, Xieting Ling
Robust test generation algorithm for stuck-open fault in CMOS circuits
DAC, 1986.
@inproceedings{DAC-1986-WeiweiX,
author = "Weiwei Mao and Xieting Ling",
booktitle = "{Proceedings of the 23rd Design Automation Conference}",
doi = "10.1145/318013.318051",
pages = "236--242",
publisher = "{IEEE Computer Society Press}",
title = "{Robust test generation algorithm for stuck-open fault in CMOS circuits}",
year = 1986,
}











