Wu-Tung Cheng
Split Circuit Model for Test Generation
DAC, 1988.
@inproceedings{DAC-1988-Cheng,
acmid = "285730.285745",
author = "Wu-Tung Cheng",
booktitle = "{Proceedings of the 25th Design Automation Conference}",
pages = "96--101",
publisher = "{ACM}",
title = "{Split Circuit Model for Test Generation}",
year = 1988,
}











