Wu-Tung Cheng
Split Circuit Model for Test Generation
DAC, 1988.
@inproceedings{DAC-1988-Cheng, acmid = "285730.285745", author = "Wu-Tung Cheng", booktitle = "{Proceedings of the 25th Design Automation Conference}", pages = "96--101", publisher = "{ACM}", title = "{Split Circuit Model for Test Generation}", year = 1988, }