CMOS Stuck-open Fault Detection Using Single Test Patterns
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Rochit Rajsuman, Anura P. Jayasumana, Yashwant K. Malaiya
CMOS Stuck-open Fault Detection Using Single Test Patterns
DAC, 1989.

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@inproceedings{DAC-1989-RajsumanJM,
	author        = "Rochit Rajsuman and Anura P. Jayasumana and Yashwant K. Malaiya",
	booktitle     = "{Proceedings of the 26th Design Automation Conference}",
	doi           = "10.1145/74382.74511",
	pages         = "714--717",
	publisher     = "{ACM Press}",
	title         = "{CMOS Stuck-open Fault Detection Using Single Test Patterns}",
	year          = 1989,
}

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