Rochit Rajsuman, Anura P. Jayasumana, Yashwant K. Malaiya
CMOS Stuck-open Fault Detection Using Single Test Patterns
DAC, 1989.
@inproceedings{DAC-1989-RajsumanJM,
author = "Rochit Rajsuman and Anura P. Jayasumana and Yashwant K. Malaiya",
booktitle = "{Proceedings of the 26th Design Automation Conference}",
doi = "10.1145/74382.74511",
pages = "714--717",
publisher = "{ACM Press}",
title = "{CMOS Stuck-open Fault Detection Using Single Test Patterns}",
year = 1989,
}