On Test Set Preservation of Retimed Circuits
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Aiman H. El-Maleh, Thomas E. Marchok, Janusz Rajski, Wojciech Maly
On Test Set Preservation of Retimed Circuits
DAC, 1995.

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@inproceedings{DAC-1995-El-MalehMRM,
	author        = "Aiman H. El-Maleh and Thomas E. Marchok and Janusz Rajski and Wojciech Maly",
	booktitle     = "{Proceedings of the 32nd Design Automation Conference}",
	doi           = "10.1145/217474.217526",
	isbn          = "0-89791-725-1",
	pages         = "176--182",
	publisher     = "{ACM Press}",
	title         = "{On Test Set Preservation of Retimed Circuits}",
	year          = 1995,
}

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