Yi-Kan Cheng, Chin-Chi Teng, Abhijit Dharchoudhury, Elyse Rosenbaum, Sung-Mo Kang
iCET: A Complete Chip-Level Thermal Reliability Diagnosis Tool for CMOS VLSI Chips
DAC, 1996.
@inproceedings{DAC-1996-ChengTDRK,
author = "Yi-Kan Cheng and Chin-Chi Teng and Abhijit Dharchoudhury and Elyse Rosenbaum and Sung-Mo Kang",
booktitle = "{Proceedings of the 33rd Design Automation Conference}",
doi = "10.1145/240518.240622",
isbn = "0-89791-779-0",
pages = "548--551",
publisher = "{ACM Press}",
title = "{iCET: A Complete Chip-Level Thermal Reliability Diagnosis Tool for CMOS VLSI Chips}",
year = 1996,
}