Hierarchical Electromigration Reliability Diagnosis for VLSI Interconnects
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Chin-Chi Teng, Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang
Hierarchical Electromigration Reliability Diagnosis for VLSI Interconnects
DAC, 1996.

DAC 1996
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@inproceedings{DAC-1996-TengCRK,
	author        = "Chin-Chi Teng and Yi-Kan Cheng and Elyse Rosenbaum and Sung-Mo Kang",
	booktitle     = "{Proceedings of the 33rd Design Automation Conference}",
	doi           = "10.1145/240518.240661",
	isbn          = "0-89791-779-0",
	pages         = "752--757",
	publisher     = "{ACM Press}",
	title         = "{Hierarchical Electromigration Reliability Diagnosis for VLSI Interconnects}",
	year          = 1996,
}

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