Stem electromigr$ (all stems)

10 papers:

DAC-2014-HuangYST #assessment #grid #network #power management

Physics-based Electromigration Assessment for Power Grid Networks (XH, TY, VS, SXDT), p. 6.

DATE-2014-SilvaLCH #multi

Electromigration-aware and IR-Drop avoidance routing in analog multiport terminal structures (RMAeS, NCL, AC, NH), pp. 1–6.

DAC-2013-MishraS #grid #power management

The impact of electromigration in copper interconnects on power grid integrity (VM, SSS), p. 6.

DATE-2011-YanC #multi

Obstacle-aware multiple-source rectilinear Steiner tree with electromigration and IR-drop avoidance (JTY, ZWC), pp. 449–454.

DAC-2004-JerkeLS #design #layout

Reliability-driven layout decompaction for electromigration failure avoidance in complex mixed-signal IC designs (GJ, JL, JS), pp. 181–184.

DATE-2002-JerkeL #analysis #verification

Hierarchical Current Density Verification for Electromigration Analysis in Arbitrary Shaped Metallization Patterns of Analog Circuits (GJ, JL), pp. 464–469.

DAC-1998-NagarajCHY #analysis #approach

A Practical Approach to Static Signal Electromigration Analysis (NSN, FC, HH, DY), pp. 572–577.

DAC-1996-DasguptaK #process #reliability

Electromigration Reliability Enhancement via Bus Activity Distribution (AD, RK), pp. 353–356.

DAC-1996-TengCRK #reliability

Hierarchical Electromigration Reliability Diagnosis for VLSI Interconnects (CCT, YKC, ER, SMK), pp. 752–757.

DAC-1991-Hwang #analysis #named

REX — A VLSI Parasitic Extraction Tool for Electromigration and Signal Analysis (JPH), pp. 717–722.