Self-test methodology for at-speed test of crosstalk in chip interconnects
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Xiaoliang Bai, Sujit Dey, Janusz Rajski
Self-test methodology for at-speed test of crosstalk in chip interconnects
DAC, 2000.

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@inproceedings{DAC-2000-BaiDR,
	author        = "Xiaoliang Bai and Sujit Dey and Janusz Rajski",
	booktitle     = "{Proceedings of the 37th Design Automation Conference}",
	doi           = "10.1145/337292.337597",
	pages         = "619--624",
	publisher     = "{ACM}",
	title         = "{Self-test methodology for at-speed test of crosstalk in chip interconnects}",
	year          = 2000,
}

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