Test Volume and Application Time Reduction Through Scan Chain Concealment
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Ismet Bayraktaroglu, Alex Orailoglu
Test Volume and Application Time Reduction Through Scan Chain Concealment
DAC, 2001.

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@inproceedings{DAC-2001-BayraktarogluO,
	author        = "Ismet Bayraktaroglu and Alex Orailoglu",
	booktitle     = "{Proceedings of the 38th Design Automation Conference}",
	doi           = "10.1145/378239.378388",
	isbn          = "1-58113-297-2",
	pages         = "151--155",
	publisher     = "{ACM}",
	title         = "{Test Volume and Application Time Reduction Through Scan Chain Concealment}",
	year          = 2001,
}

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