Ismet Bayraktaroglu, Alex Orailoglu
Test Volume and Application Time Reduction Through Scan Chain Concealment
DAC, 2001.
@inproceedings{DAC-2001-BayraktarogluO, author = "Ismet Bayraktaroglu and Alex Orailoglu", booktitle = "{Proceedings of the 38th Design Automation Conference}", doi = "10.1145/378239.378388", isbn = "1-58113-297-2", pages = "151--155", publisher = "{ACM}", title = "{Test Volume and Application Time Reduction Through Scan Chain Concealment}", year = 2001, }