BibSLEIGH — Ismet_Bayraktaroglu

Travelled to:

1 × Germany
2 × France
3 × USA

Collaborated with:

Talks about:

scan (4) diagnosi (3) test (3) bist (3) base (3) applic (2) volum (2) fault (2) time (2) superposit (1)

Person: Ismet Bayraktaroglu

2003

2002

2001

2000

DAC-2003-RaoBO: Test application time and volume compression through seed overlapping (WR, IB, AO), pp. 732–737.
DATE-2002-BayraktarogluO #fault: Gate Level Fault Diagnosis in Scan-Based BIST (IB, AO), pp. 376–381.
DAC-2001-BayraktarogluO #reduction: Test Volume and Application Time Reduction Through Scan Chain Concealment (IB, AO), pp. 151–155.
DATE-2001-BayraktarogluO: Diagnosis for scan-based BIST: reaching deep into the signatures (IB, AO), pp. 102–111.
DAC-2000-BayraktarogluO #fault: Improved fault diagnosis in scan-based BIST via superposition (IB, AO), pp. 55–58.
DATE-2000-OzevBO #synthesis: Test Synthesis for Mixed-Signal SOC Paths (SO, IB, AO), pp. 128–133.