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Travelled to:
1 × Germany
2 × France
3 × USA
Collaborated with:
A.Orailoglu W.Rao S.Ozev
Talks about:
scan (4) diagnosi (3) test (3) bist (3) base (3) applic (2) volum (2) fault (2) time (2) superposit (1)

Person: Ismet Bayraktaroglu

DBLP DBLP: Bayraktaroglu:Ismet

Contributed to:

DAC 20032003
DATE 20022002
DAC 20012001
DATE 20012001
DAC 20002000
DATE 20002000

Wrote 6 papers:

Test application time and volume compression through seed overlapping (WR, IB, AO), pp. 732–737.
DATE-2002-BayraktarogluO #fault
Gate Level Fault Diagnosis in Scan-Based BIST (IB, AO), pp. 376–381.
DAC-2001-BayraktarogluO #reduction
Test Volume and Application Time Reduction Through Scan Chain Concealment (IB, AO), pp. 151–155.
Diagnosis for scan-based BIST: reaching deep into the signatures (IB, AO), pp. 102–111.
DAC-2000-BayraktarogluO #fault
Improved fault diagnosis in scan-based BIST via superposition (IB, AO), pp. 55–58.
DATE-2000-OzevBO #synthesis
Test Synthesis for Mixed-Signal SOC Paths (SO, IB, AO), pp. 128–133.

Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
Hosted as a part of SLEBOK on GitHub.