Reduction of SOC test data volume, scan power and testing time using alternating run-length codes
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Anshuman Chandra, Krishnendu Chakrabarty
Reduction of SOC test data volume, scan power and testing time using alternating run-length codes
DAC, 2002.

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@inproceedings{DAC-2002-ChandraC,
	author        = "Anshuman Chandra and Krishnendu Chakrabarty",
	booktitle     = "{Proceedings of the 39th Design Automation Conference}",
	doi           = "10.1145/513918.514090",
	isbn          = "1-58113-461-4",
	pages         = "673--678",
	publisher     = "{ACM}",
	title         = "{Reduction of SOC test data volume, scan power and testing time using alternating run-length codes}",
	year          = 2002,
}

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