Defect tolerant probabilistic design paradigm for nanotechnologies
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Margarida F. Jacome, Chen He, Gustavo de Veciana, Stephen Bijansky
Defect tolerant probabilistic design paradigm for nanotechnologies
DAC, 2004.

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@inproceedings{DAC-2004-JacomeHVB,
	author        = "Margarida F. Jacome and Chen He and Gustavo de Veciana and Stephen Bijansky",
	booktitle     = "{Proceedings of the 41st Design Automation Conference}",
	doi           = "10.1145/996566.996730",
	isbn          = "1-58113-828-8",
	pages         = "596--601",
	publisher     = "{ACM}",
	title         = "{Defect tolerant probabilistic design paradigm for nanotechnologies}",
	year          = 2004,
}

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