On test generation for transition faults with minimized peak power dissipation
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Wei Li, Sudhakar M. Reddy, Irith Pomeranz
On test generation for transition faults with minimized peak power dissipation
DAC, 2004.

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@inproceedings{DAC-2004-LiRP,
	author        = "Wei Li and Sudhakar M. Reddy and Irith Pomeranz",
	booktitle     = "{Proceedings of the 41st Design Automation Conference}",
	doi           = "10.1145/996566.996706",
	isbn          = "1-58113-828-8",
	pages         = "504--509",
	publisher     = "{ACM}",
	title         = "{On test generation for transition faults with minimized peak power dissipation}",
	year          = 2004,
}

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