Wei Li, Sudhakar M. Reddy, Irith Pomeranz
On test generation for transition faults with minimized peak power dissipation
DAC, 2004.
@inproceedings{DAC-2004-LiRP,
author = "Wei Li and Sudhakar M. Reddy and Irith Pomeranz",
booktitle = "{Proceedings of the 41st Design Automation Conference}",
doi = "10.1145/996566.996706",
isbn = "1-58113-828-8",
pages = "504--509",
publisher = "{ACM}",
title = "{On test generation for transition faults with minimized peak power dissipation}",
year = 2004,
}