Jie Gu, Sachin S. Sapatnekar, Chris H. Kim
Width-dependent Statistical Leakage Modeling for Random Dopant Induced Threshold Voltage Shift
DAC, 2007.
@inproceedings{DAC-2007-GuSK,
author = "Jie Gu and Sachin S. Sapatnekar and Chris H. Kim",
booktitle = "{Proceedings of the 44th Design Automation Conference}",
doi = "10.1145/1278480.1278503",
pages = "87--92",
publisher = "{IEEE}",
title = "{Width-dependent Statistical Leakage Modeling for Random Dopant Induced Threshold Voltage Shift}",
year = 2007,
}