Width-dependent Statistical Leakage Modeling for Random Dopant Induced Threshold Voltage Shift
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Jie Gu, Sachin S. Sapatnekar, Chris H. Kim
Width-dependent Statistical Leakage Modeling for Random Dopant Induced Threshold Voltage Shift
DAC, 2007.

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@inproceedings{DAC-2007-GuSK,
	author        = "Jie Gu and Sachin S. Sapatnekar and Chris H. Kim",
	booktitle     = "{Proceedings of the 44th Design Automation Conference}",
	doi           = "10.1145/1278480.1278503",
	pages         = "87--92",
	publisher     = "{IEEE}",
	title         = "{Width-dependent Statistical Leakage Modeling for Random Dopant Induced Threshold Voltage Shift}",
	year          = 2007,
}

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