Xin Li, Lawrence T. Pileggi
Efficient Parametric Yield Extraction for Multiple Correlated Non-Normal Performance Distributions of Analog/RF Circuits
DAC, 2007.
@inproceedings{DAC-2007-LiP,
	author        = "Xin Li and Lawrence T. Pileggi",
	booktitle     = "{Proceedings of the 44th Design Automation Conference}",
	doi           = "10.1145/1278480.1278709",
	pages         = "928--933",
	publisher     = "{IEEE}",
	title         = "{Efficient Parametric Yield Extraction for Multiple Correlated Non-Normal Performance Distributions of Analog/RF Circuits}",
	year          = 2007,
}











