Tao Li, Zhiping Yu
Statistical Analysis of Full-Chip Leakage Power Considering Junction Tunneling Leakage
DAC, 2007.
@inproceedings{DAC-2007-LiY,
author = "Tao Li and Zhiping Yu",
booktitle = "{Proceedings of the 44th Design Automation Conference}",
doi = "10.1145/1278480.1278505",
pages = "99--102",
publisher = "{IEEE}",
title = "{Statistical Analysis of Full-Chip Leakage Power Considering Junction Tunneling Leakage}",
year = 2007,
}











