Tao Li, Wenjun Zhang, Zhiping Yu
Full-chip leakage analysis in nano-scale technologies: mechanisms, variation sources, and verification
DAC, 2008.
@inproceedings{DAC-2008-LiZY,
	author        = "Tao Li and Wenjun Zhang and Zhiping Yu",
	booktitle     = "{Proceedings of the 45th Design Automation Conference}",
	doi           = "10.1145/1391469.1391622",
	isbn          = "978-1-60558-115-6",
	pages         = "594--599",
	publisher     = "{ACM}",
	title         = "{Full-chip leakage analysis in nano-scale technologies: mechanisms, variation sources, and verification}",
	year          = 2008,
}











