Ender Yilmaz, Sule Ozev
Adaptive test elimination for analog/RF circuits
DAC, 2009.
@inproceedings{DAC-2009-YilmazO,
author = "Ender Yilmaz and Sule Ozev",
booktitle = "{Proceedings of the 46th Design Automation Conference}",
doi = "10.1145/1629911.1630098",
isbn = "978-1-60558-497-3",
pages = "720--725",
publisher = "{ACM}",
title = "{Adaptive test elimination for analog/RF circuits}",
year = 2009,
}











