Jun Zhou, Senthil Jayapal, Ben Busze, Li Huang, Jan Stuyt
A 40 nm inverse-narrow-width-effect-aware sub-threshold standard cell library
DAC, 2011.
@inproceedings{DAC-2011-ZhouJBHS,
author = "Jun Zhou and Senthil Jayapal and Ben Busze and Li Huang and Jan Stuyt",
booktitle = "{Proceedings of the 48th Design Automation Conference}",
doi = "10.1145/2024724.2024827",
isbn = "978-1-4503-0636-2",
pages = "441--446",
publisher = "{ACM}",
title = "{A 40 nm inverse-narrow-width-effect-aware sub-threshold standard cell library}",
year = 2011,
}