Wujie Wen, Yaojun Zhang, Yiran Chen, Yu Wang, Yuan Xie
PS3-RAM: a fast portable and scalable statistical STT-RAM reliability analysis method
DAC, 2012.
@inproceedings{DAC-2012-WenZCWX,
author = "Wujie Wen and Yaojun Zhang and Yiran Chen and Yu Wang and Yuan Xie",
booktitle = "{Proceedings of the 49th Annual Design Automation Conference}",
doi = "10.1145/2228360.2228580",
isbn = "978-1-4503-1199-1",
pages = "1191--1196",
publisher = "{ACM}",
title = "{PS3-RAM: a fast portable and scalable statistical STT-RAM reliability analysis method}",
year = 2012,
}











