Xin Zhao, Michael Scheuermann, Sung Kyu Lim
Analysis of DC current crowding in through-silicon-vias and its impact on power integrity in 3D ICs
DAC, 2012.
@inproceedings{DAC-2012-ZhaoSL,
author = "Xin Zhao and Michael Scheuermann and Sung Kyu Lim",
booktitle = "{Proceedings of the 49th Annual Design Automation Conference}",
doi = "10.1145/2228360.2228391",
isbn = "978-1-4503-1199-1",
pages = "157--162",
publisher = "{ACM}",
title = "{Analysis of DC current crowding in through-silicon-vias and its impact on power integrity in 3D ICs}",
year = 2012,
}
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