Haluk Konuk, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Deepak Solanki, Jerzy Tyszer, Justyna Zawada
Design for low test pattern counts
DAC, 2015.
@inproceedings{DAC-2015-KonukMMRSTZ,
author = "Haluk Konuk and Elham K. Moghaddam and Nilanjan Mukherjee and Janusz Rajski and Deepak Solanki and Jerzy Tyszer and Justyna Zawada",
booktitle = "{Proceedings of the 52nd Annual Design Automation Conference}",
doi = "10.1145/2744769.2744817",
isbn = "978-1-4503-3520-1",
pages = "6",
publisher = "{ACM}",
title = "{Design for low test pattern counts}",
year = 2015,
}