Travelled to:3 × USA
Collaborated with:J.Rajski J.Tyszer M.Kassab M.Gebala G.Mrugalski H.Konuk E.K.Moghaddam D.Solanki J.Zawada
Talks about:test (2) architectur (1) function (1) compress (1) softwar (1) pattern (1) acceler (1) design (1) simul (1) impli (1)
Person: Nilanjan Mukherjee
DBLP: Mukherjee:Nilanjan
Contributed to:
201520141995Wrote 3 papers:
- DAC-2015-KonukMMRSTZ #design
- Design for low test pattern counts (HK, EKM, NM, JR, DS, JT, JZ), p. 6.
- DAC-2014-GebalaMMRT #on the #using
- On Using Implied Values in EDT-based Test Compression (MG, GM, NM, JR, JT), p. 6.
- DAC-1995-KassabMRT #architecture #fault #functional #simulation
- Software Accelerated Functional Fault Simulation for Data-Path Architectures (MK, NM, JR, JT), pp. 333–338.